John D. Tobin Jr.: search on Z-Library

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1

The kinetic model of the shikimate pathway as a tool to optimize enzyme assays for high-throughput screening

Michael Noble, Yugesh Sinha, Aleksey Kolupaev, Oleg Demin, David Earnshaw, Frank Tobin, Joshua West, John D. Martin, Chunyan Qiu, Wu-Schyong Liu, Walter E. DeWolf Jr., David Tew, Igor I. Goryanin

Journal:

Biotechnology and Bioengineering

Year:

2006

Language:

english

File:

PDF, 589 KB

english, 2006

2

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Data Analysis and Modeling for Process Control - Yield loss in lithographic patterning at the 65nm node and beyond

Monahan, Kevin M., Tobin, Jr., Kenneth W., Eichelberger, Brad, Hankinson, Matt, Robinson, John, Slessor, Mike

Year:

2004

Language:

english

File:

PDF, 492 KB

english, 2004

3

Reflections on Dudley Dillard's Career

John Adams, Vernon M. Briggs, Jr., Andrew Kochera, Jim Rossman and James Tobin

Journal:

Journal of Economic Issues

Year:

1993

Language:

english

File:

PDF, 896 KB

english, 1993

4

Microcirculation research, angiogenesis, and microsurgery

Johannes M. Frank, Shino Kaneko, Charles Joels, Gordon R. Tobin, Joseph C. Banis Jr., Dr. John H. Barker

Journal:

Year:

1994

Language:

english

File:

PDF, 544 KB

english, 1994

5

Exploratory mediastinotomy in primary myocardial disease

George C. Sutton, John F. Driscoll, Rolf M. Gunnar, John R. Tobin Jr.

Journal:

Progress in Cardiovascular Diseases

Year:

1964

Language:

english

File:

PDF, 3.74 MB

english, 1964

6

SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Detection and Remediation Technologies for Mines and Minelike Targets IX - Wideband frequency response of low-metal mines

Dalichaouch, Yacine, Harmon, Russell S., Broach, J. Thomas, Whitecotton, Brian W., McManus, Tobin, Holloway, Jr., John H., Kuhn, Steve, Trammell, Hoke S., Shelby, Richard A., Carin, Lawrence

Year:

2004

Language:

english

File:

PDF, 69 KB

english, 2004

7

Treatment of somnambulism with anticipatory awakening

John D. Tobin Jr.

Journal:

The Journal of Pediatrics

Year:

1993

Language:

english

File:

PDF, 177 KB

english, 1993

8

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Process and Materials Characterization and Diagnostics in IC Manufacturing - Advanced ASIC defect control

May, Chuck, Knoch, John, Young, Roger Y. B., Tobin, Jr., Kenneth W., Emami, Iraj

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

9

Alcoholic cardiomyopathy

Rolf M. Gunnar, George C. Sutton, Raymond J. Pietras, John R. Tobin Jr.

Journal:

Disease-a-Month

Year:

1971

Language:

english

File:

PDF, 2.22 MB

english, 1971

10

Comment on the radiographic grading scales for osteoarthritis of the hand

Marina D. Sew Hoy, John L. O'Donnell, Peter W. Moller, Douglas Kallman, William W. Scott Jr., Marc C. Hochberg, Fredrick M. Wigley, Jordan D. Tobin

Journal:

Arthritis & Rheumatism

Year:

1991

Language:

english

File:

PDF, 101 KB

english, 1991

11

53. The spatial vectorcardiogram in left bundle branch block

Jaime Neuman, Jorge Blackaller, Paul B. Szanto, Rolf M. Gunnar, John R. Tobin Jr

Journal:

The American Journal of Cardiology

Year:

1965

Language:

english

File:

PDF, 241 KB

english, 1965

12

SPIE Proceedings [SPIE Design, Process Integration, and Characterization for Microelectronics - Santa Clara, CA (Wednesday 6 March 2002)] Design, Process Integration, and Characterization for Microelectronics - Developing an integrated imaging system for the 70-nm node using high numerical aperture ArF lithography

Petersen, John S., Beach, James V., Gerold, David J., Maslow, Mark J., Starikov, Alexander, Tobin, Jr., Kenneth W.

Year:

2002

Language:

english

File:

PDF, 443 KB

english, 2002

13

SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - Depth measurement of moving slurry at the wet end of a paper machine

Goddard, Jr., James S., Sari-Sarraf, Hamed, Turner, John C., Hunt, Martin A., Abidi, Besma R., Tobin, Jr., Kenneth W., Chang, Ning S.

Year:

1999

Language:

english

File:

PDF, 2.43 MB

english, 1999

14

SPIE Proceedings [SPIE Quality Control by Artificial Vision - Gatlinburg, United States (Monday 19 May 2003)] Sixth International Conference on Quality Control by Artificial Vision - Detection of cavitation pits on steel surfaces using SEM imagery

Price, Jeffery R., Hylton, Kathy W., Tobin, Jr., Kenneth W., Bingham, Philip R., Hunn, John D., Haines, John R., Tobin, Jr., Kenneth W., Meriaudeau, Fabrice

Year:

2003

Language:

english

File:

PDF, 809 KB

english, 2003

15

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Process and Materials Characterization and Diagnostics in IC Manufacturing - CD-SEM measurement line edge roughness test patterns for 193 nm lithography

Bunday, Benjamin D., Bishop, Michael, Villarrubia, John S., Vladar, Andras E., Tobin, Jr., Kenneth W., Emami, Iraj

Year:

2003

Language:

english

File:

PDF, 734 KB

english, 2003

16

SPIE Proceedings [SPIE Design, Process Integration, and Characterization for Microelectronics - Santa Clara, CA (Wednesday 6 March 2002)] Design, Process Integration, and Characterization for Microelectronics - Robust methodology for state-of-the-art embedded SRAM bitcell design

Craig, Mark J., Petersen, John S., Lund, Joshua, Gerold, David J., Chen, Nien-Po, Starikov, Alexander, Tobin, Jr., Kenneth W.

Year:

2002

Language:

english

File:

PDF, 314 KB

english, 2002

17

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Data Analysis and Modeling for Process Control - In-tool process control for advanced patterning based on integrated metrology

Mui, David S. L., Tobin, Jr., Kenneth W., Sasano, Hiroki, Liu, Wei, Yamartino, John, Skumanich, Andrew

Year:

2004

Language:

english

File:

PDF, 361 KB

english, 2004

18

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Data Analysis and Modeling for Process Control - Automated fault detection and classification of etch systems using modular neural networks

Hong, Sang J., Tobin, Jr., Kenneth W., May, Gary S., Yamartino, John, Skumanich, Andrew

Year:

2004

Language:

english

File:

PDF, 1.60 MB

english, 2004

19

CLINICAL SIGNS AND NATURAL HISTORY OF ALCOHOLIC HEART DISEASE

Rolf M. Gunnar, John Demakis, Shahbudin H. Rahimtoola, Mohamed Ziad Sinno, John R. Tobin Jr.

Journal:

Annals of the New York Academy of Sciences

Year:

1975

Language:

english

File:

PDF, 460 KB

english, 1975

20

Endocarditis in the drug addict

Ruth G. Ramsey, Rolf M. Gunnar, John R. Tobin Jr.

Journal:

The American Journal of Cardiology

Year:

1970

Language:

english

File:

PDF, 760 KB

english, 1970

21

Autoantibodies to Hair Follicles in C3H/HeJ Mice With Alopecia Areata-Like Hair Loss.

Tobin, Desmond J., Sundberg, John P., King Jr., Lloyd E., Boggess, Dawnalyn, Bystryn, Jean-Claude

Journal:

The Journal of Investigative Dermatology

Year:

1997

File:

PDF, 1.93 MB

1997

22

The lta4h Locus Modulates Susceptibility to Mycobacterial Infection in Zebrafish and Humans

David M. Tobin, Jay C. Vary Jr., John P. Ray, Gregory S. Walsh, Sarah J. Dunstan, Nguyen D. Bang, Deanna A. Hagge, Saraswoti Khadge, Mary-Claire King, Thomas R. Hawn, Cecilia B. Moens, Lalita Ramakris

Journal:

Year:

2010

Language:

english

File:

PDF, 1.47 MB

english, 2010

23

The spatial vectorcardiogram in left bundle branch block

Jaime Neuman, Jorge Blackaller, John R. Tobin Jr., Paul B. Szanto, Rolf M. Gunnar

Journal:

The American Journal of Cardiology

Year:

1965

Language:

english

File:

PDF, 584 KB

english, 1965

24

Percent left ventricular stroke work loss: A simplified hemodynamic concept for assessment of valvular aortic stenosis

John R. Tobin Jr., Shahbudin H. Rahimtoola, Peter E. Blundell, H.J.C. Swan

Journal:

The American Journal of Cardiology

Year:

1966

Language:

english

File:

PDF, 233 KB

english, 1966

25

SPIE Proceedings [SPIE OE Fiber - DL tentative - Boston, MA (Sunday 1 September 1991)] Fiber Optic and Laser Sensors IX - Results of a portable fiber optic weigh-in-motion system

Muhs, Jeffrey D., Jordan, John K., Scudiere, Matthew B., Tobin, Jr., Kenneth W., DePaula, Ramon P., Udd, Eric

Year:

1991

Language:

english

File:

PDF, 1003 KB

english, 1991

26

SPIE Proceedings [SPIE Electronic Imaging - San Jose, CA (Saturday 22 January 2000)] Machine Vision Applications in Industrial Inspection VIII - Unambiguous interferometric surface profilometry using liquid crystal modulators

Begbie, Mark L., Lesso, John P., Sibbett, Wilson, Padgett, Miles J., Tobin, Jr., Kenneth W.

Year:

2000

Language:

english

File:

PDF, 1.02 MB

english, 2000

27

SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Interferometry: Surface Characterization and Testing - Automated alignment system for aspheric mirrors

Maxey, L. Curt, Dress, William B., Rogers, JoEllen, Tobin, Jr., Kenneth W., Creath, Katherine, Greivenkamp, John E.

Year:

1992

Language:

english

File:

PDF, 490 KB

english, 1992

28

Isolated congenital pulmonic insufficiency: Differentiation of mild from severe regurgitation∗

Rimgaudas Nemickas, Jerry Roberts, Rolf M. Gunnar, John R. Tobin Jr.

Journal:

The American Journal of Cardiology

Year:

1964

Language:

english

File:

PDF, 1.95 MB

english, 1964

29

Antibody repertoire development in fetal and neonatal piglets: XXI. Usage of most VH genes remains constant during fetal and postnatal development

John E. Butler, Xuizhu Sun, Nancy Wertz, Kelly M. Lager, Kathryn Chaloner, Joseph Urban Jr., David L. Francis, Peter L. Nara, Gregory J. Tobin

Journal:

Molecular Immunology

Year:

2011

Language:

english

File:

PDF, 780 KB

english, 2011

30

Comparison of Alopecia areata in Human and Nonhuman Mammalian Species

McElwee, Kevin J., Boggess, Dawnalyn, Olivry, Thierry, Oliver, Roy F., Whiting, David, Tobin, Desmond J., Bystryn, Jean-Claude, King, Jr., Lloyd E., Sundberg, John P.

Journal:

Year:

1998

Language:

english

File:

PDF, 634 KB

english, 1998

31

SPIE Proceedings [SPIE Advanced Microelectronic Manufacturing - Santa Clara, CA (Sunday 23 February 2003)] Process and Materials Characterization and Diagnostics in IC Manufacturing - Novel technique for contamination analysis around the edge, the bevel, and the edge exclusion area of 200 and 300mm silicon wafers

Sparks, Chris M., Gondran, Carolyn, Lysaght, Patrick S., Donahue, John T., Tobin, Jr., Kenneth W., Emami, Iraj

Year:

2003

Language:

english

File:

PDF, 277 KB

english, 2003

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